Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)

This training provides a comprehensive overview of FIB-SEM technology, covering its key components, operational principles, and technical specifications. Learn about imaging workflows, industry benchmarks, and diverse applications in materials science, biology, and failure analysis. Explore detailed operational techniques, including sample preparation and maintenance procedures, along with troubleshooting strategies for optimal performance. Conclude with insights into emerging trends and...