Give a lecture on FIB-SEM for materials characterization.

This lecture provides a comprehensive overview of FIB-SEM technology, emphasizing its importance in materials characterization. It covers operational fundamentals, including instrumentation and principles of focused ion beams and SEM. Participants will explore applications in microscale material preparation, 3D imaging, and surface modification. Advanced dual-beam techniques, nanofabrication methods, and innovations are discussed alongside case studies in metallurgy and semiconductors....